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Author Mehdipour, F. ♦ Noori, H. ♦ Javadi, B. ♦ Honda, H. ♦ Inoue, K. ♦ Murakami, K.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2009
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations
Subject Keyword Analytical models ♦ Performance analysis ♦ Computational Intelligence Society ♦ Information technology ♦ Java ♦ Design optimization ♦ Information analysis ♦ Computational modeling ♦ Computer simulation ♦ Information science
Abstract Performance evaluation is a serious challenge in designing or optimizing reconfigurable instruction set processors. The conventional approaches based on synthesis and simulations are very time consuming and need a considerable design effort. A combined analytical and simulation-based model (CAnSO) is proposed and validated for performance evaluation of a typical reconfigurable instruction set processor. The proposed model consists of an analytical core that incorporates statistics gathered from cycle-accurate simulation to make a reasonable evaluation and provide a valuable insight. Compared to cycle-accurate simulation results, CAnSO proves almost 2% variation in the speedup measurement.
Description Author affiliation: Department Of Informatics, Kyushu University, Japan (Inoue, K.; Murakami, K.) || Computer Engineering and IT Department, Amirkabir University of Technology, Iran (Javadi, B.) || Faculty of Information, Science and Electrical Engineering, Kyushu University, Japan (Mehdipour, F.) || Institute of Systems, Information Technologies and Nanotechnologies, Japan (Noori, H.; Honda, H.)
ISBN 9781424427482
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2009-01-19
Publisher Place Japan
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 198.42 kB
Page Count 6
Starting Page 564
Ending Page 569

Source: IEEE Xplore Digital Library