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Author Perfetto, J.C. ♦ Ruiz, A. ♦ D'Attellis, C.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2006
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science ♦ Technology ♦ Medicine & health
Subject Keyword Fluctuations ♦ Algorithm design and analysis ♦ Doped fiber amplifiers ♦ Fractals ♦ Heart ♦ Pathology ♦ Biomedical engineering ♦ Hospitals ♦ Magnetic heads ♦ Testing
Abstract The detrended fluctuation analysis (DFA) [1] method is used to quantify the fractal-like scaling properties of the variability of cardiac parameters, i.e. R-R interval data. DFA has proved to be a useful index in predicting survival in heart failure. Several authors have proposed to break the numerical series in two zones with linear slopes.. The breakpoint between segments is empirically situated at log n equals 1,1. We have used the DFA method to process records of passive head up tilt (H.U.T) test done to patients who have suffered one or more faint episodes. Slopes of numerical series obtained from real signals neither change at a specific point, nor have only one breakpoint, especially if they correspond to pathological records. On the contrary some of them present abrupt changes in slope. This fact could be hidden in the traditional computation if changes in slope have different sign, but are detected in our approach. A method that tracks the DFA function, detect breakpoints, and obtain a continuous set of lines between them, and their corresponding slopes, is proposed.
Description Author affiliation: Biomed. Eng. Inst., Buenos Aires Univ., Buenos Aires (Perfetto, J.C.)
ISBN 9781424425327
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2006-09-17
Publisher Place Spain
Rights Holder Computers in Cardiology(CinC)
Size (in Bytes) 72.96 kB
Page Count 4
Starting Page 629
Ending Page 632


Source: IEEE Xplore Digital Library