Thumbnail
Access Restriction
Subscribed

Author Tarhini, A. ♦ Rollet, A. ♦ Fouchal, H.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2005
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword System testing ♦ Robustness ♦ Real time systems ♦ Automatic testing ♦ Degradation ♦ Automata ♦ Hazards ♦ Delay ♦ Software testing ♦ Assembly systems
Abstract Summary form only given. In this paper, we suggest a realistic methodology for testing robustness of real-time component-based systems (RTCBS). A RTCBS system is described as a collection of components where each component is specified by a nominal and a degraded specification, modeled as a timed input-output automaton (TIOA). Further, the communication of the whole system is also specified by its nominal and degraded specification. We extract test sequences from the nominal specification and we inject automatically faults in order to model hostile environments. Then, we present an adequate test architecture consisting of the system under test (SUT) of components, and a distributed tester that consists of a set of coordinating testers. Each tester is dedicated to test a single SUT component. A test execution algorithm with an approach to handle testers coordination and execution delay is presented. Testing the SUT is divided into two phases. In the first phase, the tester tests the robustness of each component in isolation. If all components are robust according to the inserted hazards, in the second phase, we use the nominal and degraded specification of the whole system to check the robustness of communications between components.
Description Author affiliation: LICA/CReSTIC, Univ. de Reims, France (Tarhini, A.; Rollet, A.)
ISBN 078038735X
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2005-01-06
Publisher Place Egypt
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 290.94 kB


Source: IEEE Xplore Digital Library