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Author Katoh, K. ♦ Namba, K. ♦ Ito, H.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2010
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Delay ♦ Semiconductor device measurement ♦ Area measurement ♦ Logic gates ♦ Clocks ♦ System-on-a-chip ♦ failure prediction ♦ on-chip delay measurement ♦ embedded delay measurement circuit ♦ direct delay measurement ♦ small-delay defect detection
Abstract This paper presents a low area on-chip delay measurement system using an embedded delay measurement circuit. To reduce the area, the proposed method does not demand the measurement of the exact path under measurement, but the measurement of a path including the path under measurement and wires of clock tree unlike the conventional methods. The proposed Stop Signal Generator (SSG) consists of OR gate trees and a selector circuit. In addition, the area of SSG is lower than the conventional one. SSG is additional circuit which sends the transition from the output of the path under measurement to the embedded delay measurement circuit. Therefore, the area of the proposed system is lower. Because the area is low, the proposed method can be used for small-delay defect detection in manufacturing testing and failure prediction due to aging after shipment. We can apply the proposed delay measurement system to any embedded delay measurement circuit that measures the time difference between the two input signal transitions sent to the circuit. The evaluation shows that the area overhead is 16.54%. It is 6.62% smaller than the conventional method, and 8.41% larger than standard scan design.
ISBN 9781424488414
ISSN 10817735
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2010-12-01
Publisher Place China
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 250.70 kB
Page Count 6
Starting Page 343
Ending Page 348

Source: IEEE Xplore Digital Library