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Author Manich, S. ♦ Wamser, M.S. ♦ Guillen, O.M. ♦ Sigl, G.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2013
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Vectors ♦ Standards ♦ Flip-flops ♦ Registers ♦ Clocks ♦ Cryptography ♦ BILBO ♦ security ♦ testability ♦ scan path ♦ attack
Abstract In this paper, we present a new scan-path structure for improving the security of systems including scan paths, which normally introduce a security critical information leak channel into a design. Our structure, named differential scan path (DiSP), divides the internal state of the scan path in two sections. During the shift-out operation, only subtraction of the two sections is provided. Inferring the internal state from this subtraction requires much guesswork that increases exponentially with scan path length while the resulting fault coverage is only marginally altered. Subtraction does not preserve parity, thus avoiding attacks using parity information. The structure is simple, needs little area and does not require unlocking keys. Through implementing the DiSP in an elliptic curve crypto-graphic coprocessor, we demonstrate how easily it can be integrated into existing design tools. Simulations show that test effectiveness is preserved and that the internal state is effectively hidden.
Description Author affiliation: Tech. Univ. Munchen - TUM, Munich, Germany (Wamser, M.S.; Guillen, O.M.; Sigl, G.) || BarcelonaTech, Univ. Politec. de Catalunya, Barcelona, Spain (Manich, S.)
ISBN 9781479908592
ISSN 10893539
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2013-09-06
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 1.75 MB
Page Count 9
Starting Page 1
Ending Page 9


Source: IEEE Xplore Digital Library