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Author Shaker, H.R. ♦ Wisniewski, R. ♦ Tabatabaeipour, S.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2009
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science ♦ Technology ♦ Engineering & allied operations
Subject Keyword Reduced order systems ♦ Control systems ♦ Automatic control ♦ Large-scale systems ♦ Switched systems ♦ Observability ♦ Equations ♦ Stability ♦ Mathematical model ♦ Hardware
Abstract A method for order reduction of switched controllers is presented in this paper. The proposed technique is based on the generalized gramian framework for model reduction and it is the carry-over of the method in [17] and [9]. To the best of our knowledge, there is no other reported result on switched controller reduction in the literature. The method is an LMI-based technique in which to avoid numerical instability and also to increase the numerical efficiency, generalized gramian based Petrov-Galerkin projection is constructed instead of the similarity transform approach for reduction. The stability of the closed-loop system under arbitrary switching signal is proven to be preserved in the reduction and the technique is applicable to both continuous and discrete time systems. The performance of the proposed method is illustrated by numerical example.
Description Author affiliation: Department of Electronic Systems, Section of Automation and Control, Aalborg University, Fredrik Bajers Vej 7, 9220, Aalborg Ø, Denmark (Shaker, H.R.; Wisniewski, R.; Tabatabaeipour, S.)
ISBN 9781424447060
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2009-12-09
Publisher Place New Zealand
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 224.17 kB
Page Count 6
Starting Page 2237
Ending Page 2242

Source: IEEE Xplore Digital Library