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Author Zhao, Yong ♦ Wu, Di ♦ Wang, Qi
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2014
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Refractive index ♦ Interference ♦ Temperature measurement ♦ Sensitivity ♦ Optical interferometry ♦ Photonic crystal fibers ♦ Optical fiber sensors ♦ photonic crystal fiber ♦ refractive index sensor ♦ Mach-Zehnder Interferometer
Abstract A compact and robust refractive index (RI) sensor based on a tapered photonic crystal fiber (PCF) Mach-Zehnder Interferometer (MZI) was proposed. It consists of a section of tapered PCF which is spliced between two single-mode fibers (SMF). A strong evanescent field was formed near the tapered region and made the susceptible to external RI variations. In addition, a PDMS detection cell is designed to increase the stability and robustness of the sensor. The interference between the core and the cladding modes of the PCF is utilized. Experimentally, the sensor exhibits highly RI sensitivity which is found to be 51.902nm/RIU within a range from 1.3411 to 1.3737. A resolution of $1.93×10^{−5}$ RIU was achieved since the OSA has a resolution of 1pm. The proposed all-fiber RI sensor based on tapered PCF is attractive due to its compact size, low cost and immunity to electromagnetic interference beyond what conventional magnetic field sensors can offer.
Description Author affiliation: College of Information Science and Engineering, Northeastern University, Shenyang, China (Zhao, Yong; Wu, Di; Wang, Qi)
ISBN 9781479901623
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2014-11-02
Publisher Place Spain
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 1.97 MB
Page Count 4
Starting Page 1080
Ending Page 1083


Source: IEEE Xplore Digital Library