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Author Wood, M.P. ♦ Ozanyan, K.B.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2011
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Temperature measurement ♦ Absorption ♦ Measurement by laser beam ♦ Tomography ♦ Laser beams ♦ Phantoms ♦ Temperature sensors
Abstract Simulations were performed to demonstrate temperature tomography using circular 32 pixel-radius temperature and (randomised but smoothed) concentration phantoms. The simulations were run on a sensor head configuration constituting 36 sets of 32 parallel beams with equal angular spacing over 180°. For each beam, data from the HITRAN 2008 database was used to simulate direct absorption measurements of a pair of HO transitions at 5263.7 and 6476.1 $cm^{−1}$ at discrete frequencies (42 in total) near the line centres. The phantom temperature ranged from 1600 – 2000 K, the concentration of HO, from 0.92% to 7.86% and pressure was uniform for each simulation, though it was varied between simulations from 1 to 25 bar. At each frequency, Landweber iteration was used to reconstruct local attenuation coefficient images from line integrals, and the Levenberg-Maquardt-Fletcher algorithm was used to fit Voigt profiles to the data at each pixel, from which the temperature was calculated. Comparison with phantoms yielded a range of root mean square errors from 16.6 K at 1 bar to 50.0 K at 25 bar.
Description Author affiliation: School of Electrical and Electronic Engineering, The University of Manchester, M13 9PL, UK (Wood, M.P.; Ozanyan, K.B.)
ISBN 9781424492909
ISSN 19300395
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2011-10-28
Publisher Place Ireland
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
e-ISBN 9781424492893
Size (in Bytes) 1.28 MB
Page Count 5
Starting Page 865
Ending Page 869


Source: IEEE Xplore Digital Library