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Author Jorez, S. ♦ Dilhaire, S. ♦ Lopez, L.P. ♦ Granby, S. ♦ Claeys, W. ♦ Uemura, K. ♦ Stockholm, J.G.
Sponsorship Tianjin Lantian High-Tech Power Sources
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2001
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Capacitive sensors ♦ Thermoelectric devices ♦ Probes ♦ Optical interferometry ♦ Optical imaging ♦ Adaptive optics ♦ Optical recording ♦ Strain measurement ♦ Optical devices ♦ Electronic components
Abstract We have developed an original optical set-up and method for the measurement of strain in electronic components. We have applied it for the study of thermoelectric devices. The method is based on speckle interferometry imaging called shearography. Two images of a same object lighted by coherent laser light are recorded upon a CCD camera through an appropriate optical system. The two images are slightly shifted one with respect to the other. This allows determining the gradient of normal surface displacement in the direction of the shift. Information taken in this manner in several directions allows to derive a map of a parameter related to the surface displacement gradients that we call "fragility factor".
Description Author affiliation: CPMOH - Universite de Bordeaux, Talence, France (Jorez, S.)
ISBN 0780372050
ISSN 10942734
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2001-06-08
Publisher Place China
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 495.99 kB
Page Count 4
Starting Page 503
Ending Page 506


Source: IEEE Xplore Digital Library