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Author Paasi, J. ♦ Smallwood, J. ♦ Salmela, H.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2003
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics
Subject Keyword Electrostatic discharge ♦ Electronic components ♦ Breakdown voltage ♦ Manufacturing ♦ Testing ♦ Consumer electronics ♦ Biological system modeling ♦ Guidelines ♦ Dielectrics and electrical insulation ♦ Semiconductor device breakdown
Abstract We propose new methods for the assessment of real ESD threats to electronic components in modern electronics manufacturing environment. The methods are the use of current threshold for damage for ESD from a source into a device, energy threshold for damage for very short ESD pulses to a device, and charge threshold for CDM type of ESD. We suggest how guideline limits for ESD damage thresholds may be derived. The concept of the current threshold has been tested by experiments.
Description Author affiliation: VTT Ind. Syst., VTT Tech. Res. Centre of Finland, Tampere, Finland (Paasi, J.; Salmela, H.) || Electrostatic Solutions Ltd., Southampton, UK (Smallwood, J.)
ISBN 9781585370573
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2003-09-21
Publisher Place USA
Rights Holder Electrostatic Discharge Association and Omnipress
Size (in Bytes) 120.00 kB
Page Count 10
Starting Page 1
Ending Page 10

Source: IEEE Xplore Digital Library