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Author Venkataraman, S. ♦ Naughton, J.F. ♦ Livny, M.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1998
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Database systems ♦ Memory management ♦ Clustering algorithms ♦ Technology management ♦ Hardware ♦ Aggregates ♦ Costs ♦ Workstations ♦ Personal communication networks ♦ Network servers
Abstract The recent dramatic improvements in the performance of commodity hardware has made clusters of workstations or PCs an attractive and economical platform upon which to build scalable database servers. These clusters have large aggregate memory capacities, however, since this global memory is distributed, good algorithms are necessary for memory management, or this large aggregate memory will go underutilized. The goal of the study is to develop and evaluate buffer management algorithms for database clusters. We propose a new buffer management algorithm, remote load sensitive caching (RLS caching), that uses novel techniques to combine data placement with a simple modification of standard client server page replacement algorithms to approximate a global LRU page replacement policy. Through an implementation in the SHORE database system, we evaluate the performance of RLS caching against other buffer management algorithms. Our study demonstrates that RLS caching indeed effectively manages the distributed memory of a server cluster.
Description Author affiliation: Santa Teresa Lab., IBM Corp., San Jose, CA, USA (Venkataraman, S.)
ISBN 0818682892
ISSN 10636382
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1998-02-23
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 168.92 kB
Page Count 8
Starting Page 514
Ending Page 521

Source: IEEE Xplore Digital Library