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Author Patel, C. ♦ Muradali, F. ♦ Plusquellic, J.
Sponsorship IEEE Comput. Soc. Test Technol. Tech. Council
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2001
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Power supplies ♦ Circuit testing ♦ Transient analysis ♦ Signal analysis ♦ Power measurement ♦ Integrated circuit measurements ♦ Instruments ♦ Signal processing ♦ Voltage ♦ Performance evaluation
Abstract We discuss a circuit which measures and analyses power supply transients as defined in the test technique, Transient Signal Analysis (TSA). This circuit can replace the benchtop instrumentation and offline signal processing software used in previous work. The circuit accepts voltage transients as analog inputs from the Device-Under-Test (DUT), performs integration and outputs an analog value to the tester. The tester compares the output value to a predetermined threshold as a means of determining the pass/fail status of the DUT. This circuit is designed to simplify the hardware requirements of TSA.
Description Author affiliation: Dept. of CSEE, Maryland Univ., Baltimore, MD, USA (Patel, C.)
ISBN 0780371690
ISSN 10893539
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2001-11-01
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 778.60 kB
Page Count 9
Starting Page 704
Ending Page 712


Source: IEEE Xplore Digital Library