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Author Yousef, K. ♦ Jia, H. ♦ Allam, A. ♦ Anand, A. ♦ Pokharel, R. ♦ Kaho, T.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2014
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Phase noise ♦ Ring oscillators ♦ injection locked ring oscillator (ILRO) ♦ ring oscillator (RO) ♦ spurious signals ♦ CMOS technology ♦ pulse injection (PI) ♦ Inverters ♦ CMOS phase noise ♦ CMOS integrated circuits ♦ Delays ♦ voltage pull-down
Abstract This paper presents the design of a low DC power, low phase noise single-ended ring oscillator (RO) in 0.18 μm CMOS technology. It introduces a new RO output phase control technique. This RO uses a voltage pull-down circuit to produce different output signal phases. The proposed RO employs the pulse injection (PI) technique for phase noise and spurious signals suppression. The proposed injection locked ring oscillator (ILRO) can be used for phase shift keying (PSK) implementation. The proposed ILRO has an oscillation frequency of 4.5 GHz with a fine tuning range of 540 MHz. It consumes only a 4.25 mW of power while having a phase noise of -130.9 dBc/Hz @ 1MHz offset. Through this ILRO design, a figure of merit (FoM) of -197.68 dBc/Hz has been achieved.
Description Author affiliation: E-JUST Center, Kyushu Univ., Fukuoka, Japan (Jia, H.) || NTT, Network Innovation Labs., Japan (Kaho, T.) || Grad. Sch. of ISSE, Kyushu Univ., Fukuoka, Japan (Anand, A.; Pokharel, R.) || Electron. & Commun. Eng. Dept., Egypt-Japan Univ. of Sci. & Technol., Alex, Egypt (Yousef, K.; Allam, A.)
ISBN 9781479953967
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2014-09-01
Publisher Place France
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 1.06 MB
Page Count 4
Starting Page 337
Ending Page 340

Source: IEEE Xplore Digital Library