Access Restriction

Author Scholive, M. ♦ Beroulle, V. ♦ Robach, C. ♦ Flottes, M.L. ♦ Rouzeyre, B.
Sponsorship European Design and Autom. Assoc. ♦ EDA Consortium ♦ IEEE Comput. Soc. TTTC, IEEE Comput. Soc. DATC, ECSI, ACM SIGDA, RAS
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2005
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Genetic mutations ♦ Sampling methods ♦ Software testing ♦ Circuit faults ♦ Automatic test pattern generation ♦ Hardware ♦ Automatic testing ♦ Application software ♦ Degradation ♦ Software measurement
Abstract The authors' goal is to produce validation data that can be used as an efficient (pre) test set for structural stuck-at faults. In this paper, we detail an original test-oriented mutation sampling technique used for generating such data and we present a first evaluation on these validation data with regard to a structural test.
Description Author affiliation: LCIS-ESISAR, Valence, France (Scholive, M.; Beroulle, V.; Robach, C.)
ISBN 0769522882
ISSN 15301591
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2005-03-07
Publisher Place Germany
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 93.11 kB
Page Count 2
Starting Page 1022
Ending Page 1023

Source: IEEE Xplore Digital Library