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Author Xiaoliang Bai ♦ Dey, S. ♦ Krstid, A.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2003
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Automatic test pattern generation ♦ Crosstalk ♦ Circuit testing ♦ Circuit simulation ♦ Delay effects ♦ Capacitance ♦ Manufacturing ♦ Integrated circuit interconnections ♦ Integrated circuit noise ♦ Automatic logic units
Description Author affiliation: University of California (Xiaoliang Bai)
ISBN 0780381068
ISSN 10893539
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2003-09-30
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 1.01 MB
Page Count 10
Starting Page 112
Ending Page 121


Source: IEEE Xplore Digital Library