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Author Harrison, S. ♦ Noeninckx, G. ♦ Horwood, P. ♦ Collins, P.
Sponsorship IEEE Comput. Soc. Test Technol. Tech. Council
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2001
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Backplanes ♦ System testing ♦ Bridges ♦ Routing ♦ Computer architecture ♦ Automatic testing ♦ Software testing ♦ Broadcasting ♦ Process control ♦ Production facilities
Abstract The Boundary-Scan IEEE1149.1 Std. has become an important design criterion with complex IC's and Board designs within Motorola's Infrastructure products. This paper describe the "Boundary-Scan Chip-Set" that has been developed by Motorola and its component and test solution providers to enable a comprehensive boundary-scan test strategy at all levels of product build, board, system and field. The "Boundary-Scan Chip Set" allows hierarchical and multi-drop Boundary-Scan test architectures to be applied at all levels of product build. The "Boundary-Scan Chip-Set" consists of 3 distinct functions a "Bridge" a "Scan-Controller" and a "BIST-Sequencer". The "Bridge" enables a hierarchical multi-drop IEEE1149.1 Boundary-Scan implementation within a backplane configuration, whilst the "Scan-Controller" provides the necessary processor and memory interface for in-system Boundary-Scan test vectors and commands to be broadcast to slave cards within the backplane configuration. The "BIST-Sequencer" enables locally stored test vectors and commands to be executed and analyzed without on-board processor control. The Scan Chip-Set family of devices is now incorporated into Motorola infrastructure product, enhancing and improving both factory and field testability and diagnostics.
ISBN 0780371690
ISSN 10893539
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2001-11-01
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 971.91 kB
Page Count 7
Starting Page 480
Ending Page 486


Source: IEEE Xplore Digital Library