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Author Spuhler, P.S. ♦ Sola, L. ♦ Monroe, M.R. ♦ Chiari, M. ♦ Ünlü, M.S.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2010
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword DNA ♦ Indium tin oxide ♦ Fluorescence ♦ Interference ♦ Microscopy ♦ Biosensors ♦ Measurement techniques ♦ Distance measurement ♦ Molecular biophysics ♦ Electric potential ♦ optical biosensor ♦ high throughput ♦ DNA orientation and conformation ♦ indium tin oxide surface chemistries ♦ spectral self-interference fluorescence microscopy (SSFM)
Abstract We present a platform for the measurement of DNA orientation on an Indium Tin Oxide surface. We apply an interferometric measurement technique called spectral self-interference fluorescent microscopy (SSFM) that allows precise distance measurements of fluorophores from the sensor surface. SSFM can be used to infer the orientation and conformation of bound biomolecules, such as double stranded DNA. High electric fields are induced at the sensor surface through application of an electric potential between the sensor and a counter-electrode in solution and resulting orientation changes of the immobilized DNA are observed. The platform is scalable to allow micro-arrayed, high-throughput measurement of bimolecular interactions.
Description Author affiliation: Istituto di Chimica del Riconoscimento Molecolare, CNR, Milano, Italy (Sola, L.; Chiari, M.) || Department of Biomedical Engineering, Boston University, Boston, MA 02215 (Spuhler, P.S.; Monroe, M.R.; Ünlü, M.S.)
ISBN 9781424477999
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2010-06-27
Publisher Place Germany
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
e-ISBN 9781424477982
Size (in Bytes) 177.39 kB
Page Count 3
Starting Page 1
Ending Page 3

Source: IEEE Xplore Digital Library