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Author Chun-Yong Liang ♦ Meng-Fan Wu ♦ Jiun-Lang Huang
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2010
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Noise ♦ Hardware ♦ Noise reduction ♦ Power supplies ♦ Circuit faults ♦ Registers ♦ Testing ♦ power supply noise ♦ broadcast ♦ at-speed testing ♦ test compression
Abstract This work proposes a power supply noise reduction technique for at-speed testing in the broadcast-based test compression environment. The core technology is the X-slice creation technique, it comprises the scan-chain skew-insertion hardware and the skew configuration generation algorithm. With the created X-slices, the efficiency of X-slice filling to lower the launch cycle switching activity is improved. Effectiveness of the proposed technique is validated with ISCAS89 and ITC99 benchmark circuits.
ISBN 9781424488414
ISSN 10817735
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2010-12-01
Publisher Place China
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 290.60 kB
Page Count 6
Starting Page 361
Ending Page 366


Source: IEEE Xplore Digital Library