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Author Mitra, S. ♦ Seshia, S.A. ♦ Nicolici, N.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2010
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations
Subject Keyword Computer bugs ♦ Manufacturing ♦ Circuit faults ♦ Circuit testing ♦ Technological innovation ♦ Digital systems ♦ System testing ♦ Computer crashes ♦ Crosstalk ♦ Integrated circuit manufacture ♦ Post-silicon validation
Abstract Post-silicon validation is used to detect and fix bugs in integrated circuits and systems after manufacture. Due to sheer design complexity, it is nearly impossible to detect and fix all bugs before manufacture. Post-silicon validation is a major challenge for future systems. Today, it is largely viewed as an art with very few systematic solutions. As a result, post-silicon validation is an emerging research topic with several exciting opportunities for major innovations in electronic design automation. In this paper, we provide an overview of the post-silicon validation problem and how it differs from traditional pre-silicon verification and manufacturing testing. We also discuss major postsilicon validation challenges and recent advances.
Description Author affiliation: Dept. of ECE, McMaster University, Hamilton, ON, Canada (Nicolici, N.) || Dept. of EECS, University of California, Berkeley, CA, USA (Seshia, S.A.) || Dept. of EE and Dept. of CS, Stanford University, Stanford, CA, USA (Mitra, S.)
ISBN 9781424466771
ISSN 0738100X
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2010-06-13
Publisher Place USA
Rights Holder Association for Computing Machinery, Inc. (ACM)
e-ISBN 9781450300025
Size (in Bytes) 295.22 kB
Page Count 6
Starting Page 12
Ending Page 17

Source: IEEE Xplore Digital Library