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Author Andrews, J.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1994
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Bridges ♦ Backplanes ♦ Access protocols ♦ Semiconductor device testing ♦ Broadcasting ♦ System testing ♦ Pins ♦ Counting circuits ♦ Built-in self-test ♦ Hardware
Abstract National Semiconductor's SCAN Bridge is being used to provide an addressable, multi-drop, 1149.1-based backplane test bus. Its architecture is based upon defining two additional protocols to extend IEEE 1149.1 for use as a backplane test bus: an address protocol and a park protocol. These allow features such as the single, multicast, and broadcast address modes of P1149.5 to be included in the bridge.
Description Author affiliation: Nat. Semicond. Corp., South Portland, ME, USA (Andrews, J.)
ISBN 0780321030
ISSN 10893539
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1995-10-02
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 103.03 kB


Source: IEEE Xplore Digital Library