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Author Vij, A.K.
Sponsorship IEEE Comput. Soc. Test Technol. Tech. Council ♦ IEEE Philadelphia Sect
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2002
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Testing ♦ Silicon ♦ Instruments ♦ History ♦ Predictive models ♦ Data engineering ♦ Design engineering ♦ Manufacturing processes ♦ Frequency ♦ Read-write memory
Abstract Summary form only given. Quality can be defined as "a degree of excellence". In practice, we use testing as a measure of the outgoing quality of devices. The problem is that there is not a one-to-one correlation between test and quality. Just because a unit is tested doesn't guarantee that it is defect-free. Similarly, "guaranteed-by-design" functionality, usually isn't. So, what does it mean when we talk about quality level? In essence, we are trying to increase our confidence that devices shipped to customers will work as advertised in their application. For existing products, this is relatively straightforward because of the existing history of how the device performed in the field. For new designs, the difficulty lies in trying to predict this confidence level based on simulations and engineering data. Sometimes we can extrapolate from previous generations of a design or other devices which are being manufactured on the same process technology node. But, these alone are not enough to provide a perfect forecast of how the device will succeed. As a result, the usual method of attack is to apply whatever test techniques are available and can be practically implemented for first silicon.
ISBN 0780375424
ISSN 10893539
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2002-10-10
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 78.08 kB

Source: IEEE Xplore Digital Library