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Author Alshawabkeh, M. ♦ Aslam, J.A. ♦ Kaeli, D. ♦ Dy, J.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2011
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Special computer methods
Subject Keyword Feature extraction ♦ Boosting ♦ Databases ♦ Trojan horses ♦ Bit error rate ♦ Accuracy ♦ Intrusion detection ♦ area under the ROC curve ♦ intrusion detection ♦ boosting ♦ feature selection ♦ imbalanced data
Abstract Intrusion detection systems (IDSs) are continuously evolving, with the goal of improving the security of computer infrastructures. However, one of the most significant challenges in this area is the poor detection rate, due to the presence of excessive features in a data set whose class distributions are imbalanced. Despite the relatively long existence and the promising nature of feature selection methods, most of them fail to account for imbalance class distributions, particularly, for intrusion data, leading to poor predictions for minority class samples. In this paper, we propose a new feature selection algorithm to enhance the accuracy of IDS of virtual server environments. Our algorithm assigns weights to subsets of features according to the maximized area under the ROC curve (AUC) margin it induces during the boosting process over the minority and the majority examples. The best subset of features is then selected by a greedy search strategy. The empirical experiments are carried out on multiple intrusion data sets using different commercial virtual appliances and real malwares.
ISBN 9781457720680
ISSN 10823409
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2011-11-07
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
e-ISBN 9780769545967
Size (in Bytes) 181.90 kB
Page Count 3
Starting Page 879
Ending Page 881

Source: IEEE Xplore Digital Library