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Author Harada, E. ♦ Nogiwa, H. ♦ Maruyama, S. ♦ Ogata, K. ♦ Yamada, H. ♦ Ogawa, K.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1999
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Electronic equipment testing ♦ Monitoring ♦ Geographic Information Systems ♦ Voltage transformers ♦ Optical devices ♦ Substations ♦ Maintenance ♦ Sensor systems ♦ System testing ♦ Optical sensors
Abstract To achieve the target of starting operation at the beginning of the twenty-first century, 1000 kV GIS and transformer were developed. From the viewpoint of enhancement of reliability and rationalization of operation and maintenance, not only the primary equipment but also the secondary equipment such as electronic current and voltage transformer and monitoring sensors for 1000 kV equipment are the key technologies. 1000 kV GIS and transformers, which are subjected to long-term tests in a UHV Equipment Test Site, have special structures. With an on-line monitoring system using several sensors suitable for 1000 kV equipment, we have collected testing data and monitored the functionality. For the voltage transformer, we have introduced an optical potential device. Throughout the long-term field test, we have verified the performance and the reliability. It has been found that the electronic secondary devices and systems for 1000 kV substation operated properly and these technologies are mentioned to be applicable for the future 1000 kV substations.
Description Author affiliation: Tokyo Electr. Power Co. Inc., Japan (Harada, E.)
ISBN 0780355156
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1999-04-11
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 722.46 kB
Page Count 8
Starting Page 509
Ending Page 516


Source: IEEE Xplore Digital Library