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Author Nasser, N. ♦ Hassanein, H.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2005
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Quality of service ♦ Bandwidth ♦ Call admission control ♦ Next generation networking ♦ Land mobile radio cellular systems ♦ Computer networks ♦ Telecommunication computing ♦ Multimedia computing ♦ Linear programming ♦ Upper bound
Abstract Summary form only given. In this paper we present a call admission control (CAC) policy for multimedia services that characterize the next generation of wireless cellular networks. The well-known CAC guard-channel policy is modified to maintain a pre-specified level of quality of services for multimedia calls. A semi-Markov decision process (SMDP) is used to represent the multi-class guard channel CAC policy with constraints on the dropping probabilities of multimedia handoff calls. The SMDP is formulated as a linear programming problem with the objectives of maximizing the system utilization and guaranteeing QoS of multiple classes of handoff calls with each class having particularly different QoS requirements. We show numerically that the multi-class guard channel policy deploying SMDP outperforms the existing upper-limit CAC policy as it improves the service quality by maximizing the bandwidth utilization while stratifying the quality of service constraint to upper bound of the handoff dropping probability.
Description Author affiliation: Telecommun. Res. Lab. Sch. of Comput., Queen's Univ., Kingston, Ont., Canada (Nasser, N.; Hassanein, H.)
ISBN 078038735X
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2005-01-06
Publisher Place Egypt
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 273.69 kB


Source: IEEE Xplore Digital Library