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Author Jun Ohta ♦ Yamamoto, K. ♦ Yu Oya ♦ Kagawa, K. ♦ Tokuda, T. ♦ Nunoshita, M.
Sponsorship IEEE Circuits and Syst. Soc. ♦ ACM SIGDA ♦ Inst. of Electron., Information and Commun. Eng. ♦ Information Processing Soc. of Japan
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2004
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations
Subject Keyword Frequency ♦ CMOS image sensors ♦ Optical modulation ♦ CMOS technology ♦ Sensor phenomena and characterization ♦ Crosstalk ♦ Gray-scale ♦ Image sensors ♦ Intensity modulation ♦ Phase modulation
Abstract This paper demonstrates improvement of image quality in a frequency-demodulation CMOS image sensor. We have already demonstrated fundamental characteristics of a frequency-demodulation function but the sensor shows relatively poor saturation characteristics due to a crosstalk effect. By introducing sweeping out residual carriers in a photogate and discharging them into an overflow drain, a fabricated image sensor using a standard 0.6 μm CMOS technology exhibits better saturation characteristics. The output at the saturation region increases 30 times larger than the orignial one.
Description Author affiliation: Nara Institute of Science and Technology (NAIST) (Jun Ohta)
ISBN 0780381750
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2004-01-27
Publisher Place Japan
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 157.36 kB
Page Count 2
Starting Page 575
Ending Page 576


Source: IEEE Xplore Digital Library