Access Restriction

Author Raymond, D.W. ♦ Haigh, D. ♦ Bodick, R. ♦ Ryan, B. ♦ McCombs, D.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1994
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Field programmable gate arrays ♦ EPROM ♦ Flash memory ♦ Manufacturing ♦ Circuits ♦ Logic design ♦ Costs ♦ Electronic equipment testing ♦ PROM ♦ Logic devices
Abstract Once various obstacles are overcome, board testers can serve as programming stations for in-circuit-writable devices such as FPGAs, microcontrollers, EEPROMs, and flash memories. Manufacturing cost and cycle time can be considerably reduced.
Description Author affiliation: Teradyne Inc., USA (Raymond, D.W.; Haigh, D.; Bodick, R.; Ryan, B.; McCombs, D.)
ISBN 0780321030
ISSN 10893539
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1995-10-02
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 618.50 kB
Page Count 7
Starting Page 817
Ending Page 823

Source: IEEE Xplore Digital Library