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Author Hadjidemetriou, E. ♦ Grossberg, M.D. ♦ Nayar, S.K.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2000
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Histograms ♦ Electrical capacitance tomography ♦ Lighting ♦ Image analysis ♦ Computer science ♦ System testing ♦ Image color analysis ♦ Image recognition ♦ Information retrieval ♦ Image retrieval
Abstract Histograms are used to analyze and classify images. They have been found experimentally to have low sensitivity to certain types of image morphisms, for example, viewpoint changes and object deformations. However the precise effect of these image morphisms on the histogram has not been studied. In this work we derive the complete class of local transformations that preserve the histogram or simply scale its magnitude. To achieve this the transformations are represented as solutions to families of vector fields acting on the image. It is then shown that weak perspective projection and paraperspective projection belong to this class and simply scale the histogram. The results on weak perspective projection, together with the effect of illumination, are used to compute the histogram of the projection of 3D polyhedral objects. We verify the analytical results with several examples. Moreover we present and test a system that recognizes and approximates the poses of 3D polyhedral objects independent of viewpoint.
Description Author affiliation: Dept. of Comput. Sci., Columbia Univ., New York, NY, USA (Hadjidemetriou, E.)
ISBN 0769506623
ISSN 10636919
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2000-06-15
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 321.13 kB
Page Count 7
Starting Page 410
Ending Page 416

Source: IEEE Xplore Digital Library