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Author Kimura, S. ♦ Kimura, M. ♦ Nakatani, T. ♦ Sugai, M.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1993
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Phase locked loops ♦ System testing ♦ Voltage-controlled oscillators ♦ Phase detection ♦ Transfer functions ♦ Signal processing ♦ Frequency synchronization ♦ Automatic testing ♦ Filters ♦ Phase frequency detector
Abstract We have achieved a test technology for mixed signal ATE suitable for use in a production test environment for the characterization of the loop response and VCO sensitivity of PLL's having response times of a few microseconds. This is a task that was previously not possible on mixed-signal ATE as it requires a Time Measurement Unit (TMU) utilizing a digital interpolator capable of making high speed "consecutive, instantaneous frequency measurements".
Description Author affiliation: Advantest America, Inc., Ft. Lee, NJ, USA (Kimura, S.)
ISBN 0780314301
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1993-10-17
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 610.18 kB
Page Count 8
Starting Page 697
Ending Page 704


Source: IEEE Xplore Digital Library