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Author Davis, J.S. ♦ Keezer, D.C.
Sponsorship IEEE Comput. Soc. Test Technol. Tech. Council ♦ IEEE Philadelphia Sect
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2002
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Logic testing ♦ Programmable logic arrays ♦ Programmable logic devices ♦ Circuit testing ♦ Reconfigurable logic ♦ Field programmable gate arrays ♦ Communication standards ♦ Universal Serial Bus ♦ Test equipment ♦ System testing
Abstract A general-purpose, reconfigurable logic circuit, including an FPGA and a standard USB communications port, is introduced to implement many of the functions of traditional automated test equipment (ATE). An optional port to local memory is included for applications requiring extensive test vector storage. The test core provides a substantial number of programmable I/Os for testing other circuits. It may be used either to enhance the capabilities of ATE or to provide autonomous testing within large systems or arrays of components. Based upon limitations of current BIST and ATE, the need for the digital test core is described. The test core concept is introduced, and a specific circuit design is presented. This design is first evaluated independently and is then embedded into two example applications, including: (1) a high speed transmitter/receiver, and (2) a continuity checker for high-density flip-chips.
Description Author affiliation: Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA (Davis, J.S.; Keezer, D.C.)
ISBN 0780375424
ISSN 10893539
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2002-10-10
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 524.67 kB
Page Count 8
Starting Page 438
Ending Page 445

Source: IEEE Xplore Digital Library