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Author Chien-Yen Chang ♦ Chai-Chun Li
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2008
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword bus ♦ Vehicle driving ♦ Government ♦ variable speed limit sign ♦ Optical fiber testing ♦ Road transportation ♦ Analytical models ♦ Road accidents ♦ faceLAB ♦ Traffic control ♦ Frequency ♦ Road safety ♦ driving behavior ♦ Injuries ♦ driving simulator
Abstract The benefits of variable speed limit signs (VSLS) include preventing drivers from rear-end collisions and maintaining a stable traffic flow on roads. However, the configurations of VSLS will directly or indirectly affect driverspsila recognition to VSLS systems and then influence their driving behavior. Since bus passenger occupancy is much higher than that of a small passenger car, a bus accident often causes high fatality and injury rate. Thus, this study integrates a bus driving simulator and the faceLAB system to conduct a driving simulation and analyzes visual and operational impacts of VSLS configurations on bus drivers on freeways. Results show that glance frequency, glance duration and perception reaction time (PRT) are influenced by VSLS configurations. In addition, glance duration and PRT on curved roadside VSLS are significantly higher than those on overhead VSLS. The overhead VSLS is the most effective system for bus drivers to react and slow down.
Description Author affiliation: Dept. of Transp. Technol. & Logistics Manage., Chung Hua Univ., Hsinchu (Chien-Yen Chang; Chai-Chun Li)
ISBN 9780769534732
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2008-12-09
Publisher Place Taiwan
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 724.91 kB
Page Count 6
Starting Page 1453
Ending Page 1458


Source: IEEE Xplore Digital Library