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Author Chakravarty, S. ♦ Jain, A. ♦ Radhakrishnan, N. ♦ Savage, E.W. ♦ Zachariah, S.T.
Sponsorship IEEE Comput. Soc. Test Technol. Tech. Council ♦ IEEE Philadelphia Sect
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2002
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Bridges ♦ Automatic testing ♦ Cost function ♦ Silicon ♦ Frequency ♦ Fault detection ♦ Manufacturing ♦ Application specific integrated circuits ♦ Microprocessors ♦ Temperature distribution
Abstract An impressive body of theoretical research to model the behavior of bridges exists. We take that a step further and describe an experiment to compute single cycle scan tests for bridges and evaluate them in silicon. Experimental data, on a high volume part, shows that by marginally increasing the static bridge fault coverage of realistic bridges, unique parts missed by a comprehensive set of stuck-at tests were detected. We believe that this is the first silicon data on the value of adding single cycle scan tests for bridges to the manufacturing flow.
ISBN 0780375424
ISSN 10893539
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2002-10-10
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 544.53 kB
Page Count 10
Starting Page 509
Ending Page 518


Source: IEEE Xplore Digital Library