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Author Abate, F. ♦ Sterpone, L. ♦ Violante, M. ♦ Kastensmidt, F.L.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2009
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Field programmable gate arrays ♦ Switches ♦ Nonvolatile memory ♦ Logic ♦ Aerospace electronics ♦ Robustness ♦ Circuit faults ♦ Single event upset ♦ Tiles ♦ Radiation effects
Abstract Flash-based FPGAs are increasingly demanded in safety critical fields, in particular space and avionic ones, due to their non-volatile configuration memory. Although they are almost immune to permanent loss of the configuration data, they are composed of floating gate based switches that can suffer transient effects if hit by high energetic particles with critical consequences on the implemented logic. This paper presents a new way for the analysis of the impact of Single Event Effects in Flash-based FPGAs. We proposed a new methodology to identify the most critical switches inside the configuration logic block and the most redundant and robust configuration selection for each logic function. The experimental results achieved by fault injection demonstrated the feasibility of the proposed method and show that by using the most robust functional mapping it is possible to enhance the reliability of the entire design with respect to a not robust ones.
Description Author affiliation: Universidade Federal do Rio Grande do Sul, Instituto de Informatica, Porto Alegre, Brasil (Kastensmidt, F.L.) || Politecnico di Torino, DAUIN - Dipartimento di Automatica e Informatica, Italy (Abate, F.; Sterpone, L.; Violante, M.)
ISBN 9781424437818
ISSN 15301591
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2009-04-20
Publisher Place France
Rights Holder European Design Automation Association (EDAA)
Size (in Bytes) 684.23 kB
Page Count 4
Starting Page 1226
Ending Page 1229

Source: IEEE Xplore Digital Library