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Author Millman, S.D. ♦ McCluskey, E.J. ♦ Acken, J.M.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1990
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Dictionaries ♦ Circuit faults ♦ Fault diagnosis ♦ Circuit testing ♦ Fault detection ♦ Laboratories ♦ Semiconductor device modeling ♦ CMOS technology ♦ Computational modeling ♦ Circuit simulation
Abstract It is shown that the traditional approach to diagnosing stuck-at faults with fault dictionaries generated for stuck-at faults is not appropriate for diagnosing CMOS bridging faults. A novel technique for using stuck-at-fault dictionaries to diagnose bridging faults is described. Teradyne's LASAR was used to simulate bridging and stuck-at faults in a number of combinational circuits, including parity trees, multiplexers, and the 74ASCI181 4-b, 16-function ALU (arithmetic and logic unit). When the traditional technique was used, between 30%-50% of the bridging faults were mis-diagnosed, with the presence of a failure indicated on a fault-free node. In addition, as the stuck-at-fault diagnostic ability of a test increased, the bridging fault diagnostic ability decreased. By use of the new technique. over 92% of the bridging faults in the circuits used for this research were diagnosed correctly and less than 4% led to misleading diagnoses.
Description Author affiliation: Comput. Syst. Lab., Stanford Univ., CA, USA (Millman, S.D.; McCluskey, E.J.)
ISBN 081869064X
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1990-09-10
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 1.21 MB
Page Count 11
Starting Page 860
Ending Page 870


Source: IEEE Xplore Digital Library