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Author Eriksson, H. ♦ Vinter, J. ♦ Leiner, B. ♦ Schlager, M.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2007
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Airplanes ♦ Protocols ♦ Road vehicles ♦ Lightning ♦ XML ♦ Communication system control ♦ Random access memory ♦ Automatic control ♦ Hardware ♦ Relays
Abstract This paper presents a fault injection platform targeting the communication bus in the DECOS platform, which is using a time-triggered communication protocol such as TTP or FlexRay. Communication errors are injected by a disturbance node, which emulates errors caused by external sources, e.g. from electrical relays in road vehicles or from lightning affecting airplanes. The platform is flexible and the communication protocol can be reconfigured from TTP to FlexRay or vice versa. The experiments are configured by XML scripts and controlled by Lauterbach TRACE32 software and hardware. Raw data from the experiments are stored in SRAM memory without halting the program execution so only minor time intrusiveness is introduced for logging data. After each experiment raw data are downloaded from memory, automatically parsed and converted into integer and e.g. float data types, and finally stored in a MySQL database for analysis. Several analysis functions are developed to evaluate the effectiveness of hardware-implemented and software-implemented error detection and recovery mechanisms.
Description Author affiliation: SP Tech. Res. Inst. of Sweden, Boras (Eriksson, H.; Vinter, J.)
ISBN 9781424408504
ISSN 19354576
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2007-06-23
Publisher Place Austria
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 637.53 kB
Page Count 6
Starting Page 1001
Ending Page 1006


Source: IEEE Xplore Digital Library