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Author Wei-Tek Tsai ♦ Xiaoying Bai ♦ Paul, R. ♦ Lian Yu
Sponsorship IEEE Comput. Soc
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2001
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword System testing ♦ Software testing ♦ Software systems ♦ Performance evaluation ♦ Life testing ♦ Investments ♦ Industrial engineering ♦ Information analysis ♦ Hardware ♦ Software maintenance
Abstract Regression testing has been a popular quality-assurance technique. Most regression testing techniques are based on code or software design. This paper proposes a scenario-based functional regression testing, which is based on end-to-end (E2E) integration test scenarios. The test scenarios are first represented in a template model that embodies both test dependency and traceability. By using test dependency information, one can obtain a test slicing algorithm to detect the scenarios that are affected and thus they are candidates for regression testing. By using traceability information, one can find affected components and their associated test scenarios and test cases for regression testing. With the same dependency and traceability information one can use the ripple effect analysis to identify all affected, including directly or indirectly, scenarios and thus the set of test cases can be selected for regression testing. This paper also provides several alternative test-case selection approaches and a hybrid approach to meet various requirements. A web-based tool has been developed to support these regression testing tasks.
Description Author affiliation: Dept. of Comput. Sci. & Eng., Arizona State Univ., Tempe, AZ, USA (Wei-Tek Tsai)
ISBN 0769513727
ISSN 07303157
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2001-10-08
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 529.71 kB
Page Count 6
Starting Page 496
Ending Page 501


Source: IEEE Xplore Digital Library