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Author Lau, M.F. ♦ Liu, Y. ♦ Yu, Y.T.
Sponsorship IEEE CPS
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2006
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Fault detection ♦ Software testing ♦ Australia Council ♦ Communications technology ♦ Computer science ♦ Fault diagnosis ♦ Impedance matching
Abstract Detection conditions of specific classes of faults have recently been studied by many researchers. Under the assumption that at most one of these faults occurs in the software under test, these fault detection conditions were mainly used in two ways. First, they were used to develop test case selection strategies for detecting corresponding classes of faults. Second, they were used to study fault class hierarchies, where a test case that detects a particular class of faults can also detect some other classes of faults. In this paper, we study detection conditions of double faults. Besides developing new test case selection strategies and studying new fault class hierarchies, our analysis provides further insights to the effect of fault coupling. Moreover, these fault detection conditions can be used to compare effectiveness of existing test case selection strategies (which were originally developed for the detection of single occurrence of certain classes of faults) in detecting double faults that may be present in the software
Description Author affiliation: Fac. of Inf. & Commun. Technol., Swinburne Univ. of Technol., Hawthorn, Vic. (Lau, M.F.; Liu, Y.; Yu, Y.T.)
ISBN 0769526551
ISSN 07303157
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2006-09-17
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 158.08 kB
Page Count 8
Starting Page 403
Ending Page 410


Source: IEEE Xplore Digital Library