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Author Gang Chen ♦ Rajski, J. ♦ Reddy, S. ♦ Pomeranz, I.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2009
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Circuit testing ♦ Circuit faults ♦ Automatic test pattern generation ♦ Semiconductor device testing ♦ Fault diagnosis ♦ Test pattern generators ♦ Fault detection ♦ Graphics ♦ Cities and towns ♦ Benchmark testing ♦ diagnostic test generation ♦ fault diagnosis ♦ defect diagnosis ♦ n-distinguishing ♦ n-detection
Abstract Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets, which distinguish pairs of single stuck-at faults n times, to enhance the probability of distinguishing unmodeled defects. The basis for the use of n-distinguishing test sets to enhance defect diagnosis is similar to that for using n-detection test sets to improve the detection of unmodeled defects. We use a heuristic to target a subset of fault pairs for n-distinguishing in order to improve the efficacy of the patterns generated for aiding diagnosis. Experimental results on the larger ISCAS benchmark circuits are presented to demonstrate the improvements in defect diagnostic resolution due to the use of n-distinguishing test sets. We use randomly selected resistive bridges to represent unmodeled defects. The experimental results also show that the coverage of unmodeled defects by n-distinguishing test sets is similar to that by n-detection test sets even though the number of n-distinguishing tests is typically smaller. This suggests the possibility of using n-distinguishing test sets in place of n-detection test sets in manufacturing test.
ISBN 9780769538648
ISSN 10817735
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2009-11-23
Publisher Place Taiwan
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 374.55 kB
Page Count 4
Starting Page 183
Ending Page 186


Source: IEEE Xplore Digital Library