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Author Hilla, S.C.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1992
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Multichip modules ♦ Assembly ♦ System testing ♦ Silicon ♦ Application software ♦ Probes ♦ Wire ♦ Image processing ♦ Integrated circuit interconnections ♦ Circuit testing
ISBN 0780307607
ISSN 10893539
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1995-09-20
Publisher Place MD
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 861.72 kB


Source: IEEE Xplore Digital Library