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Author Nelson, J.K.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2007
Language English
Subject Domain (in DDC) Social sciences ♦ Education ♦ Technology ♦ Engineering & allied operations
Subject Keyword Educational institutions ♦ Engineering students ♦ Job shop scheduling ♦ Employment ♦ Demography ♦ Government ♦ Humans ♦ Sampling methods ♦ Probes ♦ Data engineering ♦ Non-traditional pathways ♦ Student retention and persistence ♦ Community college ♦ Diversity
Abstract Community colleges are frequently identified as sources for increasing and diversifying the pool of engineering students. The purpose of this study is to better understand the experiences of students who transfer from community colleges to baccalaureate engineering programs. We have scheduled interviews with a diverse population of students who have transferred from Northern Virginia Community College to four-year engineering programs at George Mason University. Through one-on-one semi-structured interviews, students are asked to discuss (1) their decision to enroll at NVCC, (2) their decision to pursue a four-year engineering degree, and (3) their adjustment experience during the transfer process. In particular, the effects of outside employment and full-time vs. part-time student status are explored. We will analyze interview responses in combination with academic and demographic data to identify (1) factors that have influenced the academic paths of transfer students and (2) actions that may encourage a larger population to consider similar paths.
Description Author affiliation: George Mason Univ., Fairfax (Nelson, J.K.)
ISBN 9781424410835
ISSN 01905848
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2007-10-10
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 171.74 kB


Source: IEEE Xplore Digital Library