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Author Junjie Lu ♦ Holleman, J.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2012
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Noise ♦ Current measurement ♦ Logic gates ♦ Noise measurement ♦ Bandwidth ♦ Switches ♦ Floors
Abstract A high-bandwidth ultra-low-current measurement circuit is presented in this paper. The circuit is capable of measuring an on-chip 75 fA current at a bandwidth up to 1 kHz with a noise floor of 0.235 fArms/√Hz. A low leakage reset scheme is utilized to improve the precision. Nested auto-zeroing combined with modified correlated double sampling is employed to mitigate the error due to various circuit imperfections. Noise analysis is carried out and “capacitive noise matching” is proposed to minimize the noise floor. The circuit is also capable of digitizing the measured current and streaming the data through a serial interface. The measurement circuit occupies 0.065 $mm^{2}$ of active silicon area in a 90 nm CMOS process and consumes 147 μW from 2.5 V and 1V supplies.
Description Author affiliation: The University of Tennessee, Knoxville (Junjie Lu; Holleman, J.)
ISBN 9781467315555
ISSN 08865930
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2012-09-09
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
e-ISBN 9781467315562
Size (in Bytes) 543.10 kB
Page Count 4
Starting Page 1
Ending Page 4


Source: IEEE Xplore Digital Library