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Author Lubicki, P. ♦ Cross, J.D. ♦ Jayaram, S. ♦ Zhao, J.S. ♦ Ward, O.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1997
Language English
Subject Keyword Volatile organic compounds ♦ Electron beams ♦ Water pollution ♦ Acceleration ♦ Water resources ♦ Niobium ♦ Biomembranes ♦ Ceramics ♦ Chemical hazards ♦ Industrial waste
Abstract Experimental results concerning removal of nitrobenzene and volatile organic compounds (VOCs), such as toluene, trichloroethylene and benzene with the use of low energy electron beam are presented. Lab scale apparatus for electron beam irradiation of water is briefly described. Total dose of /spl beta/ radiation was controlled by the time of water circulation (1-50 min.), accelerating voltage (V/sub a/=100-125 kV) and electron beam current (0.1-1 mA) for flow rate of 1 kg/min. The electron beam was generated in vacuum (p<10/sup -7/ Torr) produced by a system of diffusion-sorption-rotary pumps. Electrons were injected into the treated water through an electron beam permeable membrane made of boron nitride poly-crystalline ceramics with a thickness of 10 /spl mu/m. A low mass density (/spl sim/2 g/cm/sup 3/) of the ceramic material enables to obtain a high transmission of the electron beam even for a low accelerating voltage. Dependencies of the removed content of contaminants on the total dose of /spl beta/ radiation are presented. Despite using low energy electron beam, the results have indicated a significant removal of nitrobenzene and VOCs treated.
Description Author affiliation: Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada (Lubicki, P.)
ISBN 0780338510
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1997-10-19
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 396.22 kB
Page Count 4
Starting Page 698
Ending Page 701

Source: IEEE Xplore Digital Library