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Author Tian Xia ♦ Jien-Chung Lo
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2002
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Jitter ♦ Phase measurement ♦ Phase locked loops ♦ Circuit testing ♦ Phase detection ♦ Charge pumps ♦ Counting circuits ♦ Current measurement ♦ Charge measurement ♦ Built-in self-test
Abstract In this paper, we propose an efficient on-chip method for the direct measurement of jitter in phase locked loops (PLLs). The jitter is first detected as the phase difference in the form of pulses with duration in the range of pico-seconds. A combination of a modified charge pump and a binary counter can then record the number that represents the jitter measurement. This is the first attempt to directly measure the jitter of PLLs on-chip via analog testing circuit, but with digital output. The proposed testing circuit is only about 20% of the PLL under test. The proposed on-chip jitter measurement circuit is a central part of built-in self-test for many embedded applications in SOCs.
Description Author affiliation: Dept. of Electr. & Comput. Eng., Rhode Island Univ., Kingston, RI, USA (Tian Xia; Jien-Chung Lo)
ISBN 0769518311
ISSN 15505774
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2002-11-06
Publisher Place Canada
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 497.89 kB
Page Count 9
Starting Page 399
Ending Page 407

Source: IEEE Xplore Digital Library