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Author Muramatsu, D. ♦ Makihara, Y. ♦ Yagi, Y.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2013
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Special computer methods ♦ Natural sciences & mathematics ♦ Life sciences; biology ♦ Biochemistry
Subject Keyword Decision support systems ♦ Decision making ♦ Probability
Abstract View difference is a factor that degrades the accuracy of gait recognition. A solution to reducing accuracy degradation is applying a view transformation model (VTM) that encodes a joint subspace of multi-view gait features trained from multiple training subjects. In the VTM framework, once an intrinsic vector of a test subject in the joint subspace is estimated from a gait feature with a source view (e.g. probe view), a gait feature with a destination view (e.g. gallery view) is generated for the same-view matching. Although this family of methods can improve the total accuracy, the quality of generated gait features depends on a test gait feature, and may be relevant to the accuracy of gait recognition. We therefore propose a method of incorporating the quality measure of the generated gait feature into the VTM framework. We employ the projection error into the joint subspace as the quality measure. A posterior probability is then computed by incorporating the quality measure. The accuracy evaluation against a subset of a public database collected from 1,912 subjects shows that the proposed method further improves the accuracy.
Description Author affiliation: Inst. of Sci. & Ind. Res., Osaka Univ., Ibaraki, Japan (Muramatsu, D.; Makihara, Y.; Yagi, Y.)
ISBN 9781479905270
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2013-09-29
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 361.58 kB
Page Count 8
Starting Page 1
Ending Page 8

Source: IEEE Xplore Digital Library