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Author Ray, S.K.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1989
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Distributed processing ♦ SCADA systems ♦ System testing ♦ Road transportation ♦ Software testing ♦ Distributed computing ♦ Control systems ♦ Surveillance ♦ Production facilities ♦ Supervisory control
Abstract Higher-level test techniques for acceptance testing are described, and the implications of such testing at various levels are analyzed. Simulated tests involving autonomous interfacing units are also discussed. The testing at the card level is batch-oriented and goes through automated or semiautomated testing schemes.<<ETX>>
Description Author affiliation: Petrovest a.s., Kokstad-Bergen, Norway (Ray, S.K.)
ISBN 0818619376
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1989-04-12
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 615.37 kB
Page Count 8
Starting Page 221
Ending Page 228


Source: IEEE Xplore Digital Library