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Author Goller, H.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2008
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Energy management ♦ Integrated circuit testing ♦ Pins ♦ Voltage ♦ Switches ♦ Production ♦ Life testing ♦ Batteries ♦ Relays ♦ History ♦ PMIC ATE industrial test floating HiZ
Abstract A well-known source of trouble during iddq or digital testing in production is the so-called HiZ-problem. Pattern generation tools set the ATE drivers connected to digital I or I/O DUT pins which are not supposed to have any influence on the test result to high-impedance. Thus the state of these pins during testing is not clearly defined which often leads to correlation issues. A similar problem exists for DC input pins of power management devices which are left undefined during testing. This paper explains the issues and a methodology to avoid them.
Description Author affiliation: Verigy, Boblingen (Goller, H.)
ISBN 9780769533964
ISSN 10817735
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2008-11-24
Publisher Place Japan
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 200.70 kB
Page Count 1
Starting Page 193
Ending Page 193


Source: IEEE Xplore Digital Library