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Author Temnik, A. ♦ Udod, V.
Sponsorship YUKOS
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2001
Language English
Subject Domain (in DDC) Technology
Subject Keyword Control systems ♦ Radiation detectors ♦ Solid scintillation detectors ♦ Crystals ♦ Noise level ♦ Application software ♦ X-ray detection ♦ X-ray detectors ♦ Tomography ♦ Optical noise
Abstract At present detectors characterized by non-constant spatial sensitivity to incident radiation, at least in one dimension (in a plane of controlled section), are used for some scanning systems of radiation control, in particular for systems of X-ray computer tomography. Dissimilar response to radiation in the present detectors results from use of radiation-sensitive element in the form of three-crystal set with different efficiency of registration (the central crystal has more efficient registration in comparison with side crystals). There is another way to obtain non-uniform response - irregular optic enhancement of light flux from the scintillator surface. These detectors, in comparison with traditional ones with uniform spatial sensitivity, allow increasing ultimate spatial resolution of control system without changing noise level. Within the frames of this field we have considered detectors in the form of arbitrary configuration (symmetrical one is not of necessity) composed of three scintillation crystals with equal size in the scanning direction and different thickness (sizes in the incident radiation direction). We have obtained proportions for choosing detector crystal thickness that provide the possibility of maintenance of high ultimate resolution of the control system without changing noise level.
Description Author affiliation: Res. Inst. of Introscory, Tomsk Polytech. Univ., Russia (Temnik, A.)
ISBN 0780370082
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2001-06-26
Publisher Place Russia
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 190.90 kB
Page Count 2
Starting Page 373
Ending Page 374


Source: IEEE Xplore Digital Library