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Author Tripp, M. ♦ Picano, S. ♦ Schnarch, B.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2005
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Cost function ♦ Circuit testing ♦ Automatic testing ♦ Delay effects ♦ Automatic test equipment ♦ Pulp manufacturing ♦ Drives ♦ Conference management
Abstract "Drive only" at speed functional testing is defined to be where the ATE drives input stimulus at native data rates and the results are accumulated or checked on die and the test result is accessed and checked by the automatic test equipment, ATE, at a slow data rate. This paper summarizes the various "drive only" methods and associated DFT circuits that Intel has developed, some High Volume Manufacturing, HVM, results demonstrating our success and a discussion of how this has and will continue to lead to significant cost reductions, as compared to traditional Drive & Compare functional testing
Description Author affiliation: Intel Corp. (Tripp, M.; Picano, S.; Schnarch, B.)
ISBN 0780390385
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2005-11-08
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 362.38 kB
Page Count 129
Starting Page 8
Ending Page 136

Source: IEEE Xplore Digital Library