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Author Alyuz, N. ♦ Gokberk, B. ♦ Akarun, L.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2008
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Special computer methods ♦ Natural sciences & mathematics ♦ Life sciences; biology ♦ Biochemistry
Subject Keyword Degradation ♦ Deformable models ♦ Iterative closest point algorithm ♦ Image databases ♦ Face recognition ♦ Nose ♦ Robustness ♦ Face detection ♦ Arm ♦ Testing
Abstract Facial expression variations and occlusions complicate the task of identifying persons from their 3D facial scans. We propose a new 3D face registration and recognition method based on local facial regions that is able to provide better accuracy in the presence of expression variations and facial occlusions. Proposed fast and flexible alignment method uses average regional models (ARMs), where local correspondences are inferred by the iterative closest point (ICP) algorithm. Dissimilarity scores obtained from local regional matchers are fused to robustly identify probe subjects. In this work, a multi-expression 3D face database, Bosphorus 3D face database, that contains significant amount of different expression types and realistic facial occlusion is used for identification experiments. The experimental results on this challenging database demonstrate that the proposed system improves the performance of the standard ICP-based holistic approach (71.39%) by obtaining 95.87% identification rate in the case of expression variations. When facial occlusions are present, the performance gain is even better. Identification rate improves from 47.05% to 94.12%.
Description Author affiliation: Comput. Eng. Dept., Bogazici Univ., Istanbul (Alyuz, N.; Akarun, L.) || Philips Res., Eindhoven (Gokberk, B.)
ISBN 9781424427291
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2008-09-29
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 3.37 MB
Page Count 7
Starting Page 1
Ending Page 7


Source: IEEE Xplore Digital Library