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Author Trejo, R.A.
Sponsorship IEEE ♦ IEEE Neural Networks Soc
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2002
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Special computer methods
Subject Keyword Uncertainty ♦ Artificial intelligence ♦ Fuzzy control
Description Author affiliation: Departamento de Sistemas de Informacion, Instituto Tecnologico y de Estudios Superiores de Monterrey, Atizapin, Mexico (Trejo, R.A.)
The main problem of planning is to find a sequence of actions that an agent must perform to achieve a given objective. An important part of planning is checking whether a given plan achieves the desired objective. Historically, in AI, the planning and plan checking problems were mainly formulated and solved in a deterministic environment, when the initial state is known precisely and when the results of each action in each state is known (and uniquely determined). In this deterministic case, planning is difficult, but plan checking is straightforward. In many real-life situations, we only know the probabilities of different fluents; in such situations, even plan checking becomes computationally difficult. In this paper, we describe how methods of interval computations can be used to get a feasible approximation to plan checking under probabilistic uncertainty. It turns out that some of the resulting probabilistic techniques coincides with heuristically proposed "fuzzy" methods. Thus, we justify these fuzzy heuristics as a reasonable feasible approximation to the (NP-hard) probabilistic problem.
ISBN 0780372808
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2002-05-12
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 381.19 kB
Page Count 5
Starting Page 616
Ending Page 620


Source: IEEE Xplore Digital Library