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Author Larsson, E. ♦ Vermeulen, B. ♦ Goossens, K.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2010
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Computer architecture ♦ Software debugging ♦ Silicon ♦ System-on-a-chip ♦ Inspection ♦ Instruments ♦ Intellectual property ♦ Event detection ♦ Timing ♦ Protocols ♦ distributed property checking ♦ Post silicon debug ♦ validation ♦ races ♦ monitors
Abstract Post-silicon validation and debug, or ensuring that software executes correctly on the silicon of a multi-processor system-on-chip (MPSOC) is complicated, as it involves checking global properties that are distributed on the chip. In this paper we define an architecture to non-intrusively observe global properties at run time using distributed monitors. The architecture enables to perform actions when a property holds, such as stopping (part of) the system for inspection. We apply this architecture to the problem of software races that result in incorrect communication between concurrent tasks on different processors. In a case study, where we implemented monitors, event distribution, and instruments to stop communication between intellectual property (IP) blocks, we demonstrate that these races can be detected and classified as timing violations or as FIFO protocol violations.
Description Author affiliation: Linko¨pings universitet, Sweden (Larsson, E.) || NXP Semiconductors, Netherlands (Vermeulen, B.) || Eindhoven University of Technology, Netherlands (Goossens, K.)
ISBN 9781424458349
ISSN 15301877
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2010-05-24
Publisher Place Czech Republic
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
e-ISBN 9781424458356
Size (in Bytes) 408.86 kB
Page Count 6
Starting Page 182
Ending Page 187

Source: IEEE Xplore Digital Library